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1. Dr. T. C. Chen

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   Basic page - 2017-04-06 15:41:42.0

2. E. Jan Vardaman

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   Basic page - 2017-02-20 15:50:13.0

3. Weizhong Bao

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   Basic page - 2017-02-21 14:58:39.0

4. LEBLANC Remy

   ...in and frequency cut-off than a 130nm PHEMT process, but with a much...

   Basic page - 2017-02-22 10:59:07.0

5. Jiye Yang

   ...T/RFCMOS/SiGe processes. He has 19 years of experience in semiconduc...

   Basic page - 2017-02-22 17:22:29.0

6. Michael Young

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   Basic page - 2024-12-04 13:50:01.0

7. Vivi Zhang

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   Basic page - 2017-02-24 12:03:42.0

8. Symposium VI: Metrology, Reliability and Testing

   ...sp; to designate regular talk - 15 min Monday, March 24, 2025 Shangh...

   Basic page - 2025-03-24 07:39:02.0

9. SEMICON China 2013 post show report

   PDF Version, please click here to download.

   Basic page - 2020-08-07 16:06:26.0

10. Guanyang Lin, Ph.D

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    Basic page - 2018-01-15 10:43:42.0