Conference Plenary Speakers (2027)
           
DRAM Evolution and Challenges in Cloud Era
Dr. Chao Zhao
Senior Fellow and VP of CXMT, Fellow of the European Academy of Sciences (EurASc)
 
3D Integration Technologies Enable Broad Innovations in Designs and Manufacturing of Advanced Chips and IC Systems
Dr. Guangquan Lu
Chairman, Piotech, Inc., China
 
           
Partial List of Confirmed Distinguished CSTIC 2027 Keynote & Invited Speakers
           
Stanley Seungchul (S.C) Song, Google, US
Ghavam Shahidi, IBM, USA






TBD
Guilei Wang, Beijing Superstring Academy of Memory Technology
 
Peiwen Li, National Chiao-Tung University  
           
Chao Xiang, The University of Hong Kong  
Yaoyu Tao, Peking University  
           
Bowen Zhu, Westlake University  
Xiwen Liu, The Hong Kong University of Science and Technology (Guangzhou)  
           
Xiuyan Li, Shanghai Jiao Tong University  
Jiuren Zhou, Xidian University  
           
Xuefei Li, Huazhong University of Science and Technology  
Qingzhu Zhang, Institute of Semiconductors, Chinese Academy of Sciences  
           
Jun-Wei Luo, Institute of Semiconductors, Chinese Academy of Sciences  
As Small as it Gets: Challenges and Strategies in EUV Photoresists for Future Technology Nodes
Ekinci Yasin, Paul Scherrer Institute (PSI)
 
           
Peter Hu, KLA  
Robert Eklund, Mycronic  






Anna Tchikoulaeva, Lasertec Europe
   
           
A Mechanistic Study of HBr Etch-Gas Adsorption in a Plasma Etching Chamber
Qinzhen Hao, YMTC
 
Plasma Etch and Advanced Pattering in Advanced DRAM Technology
Juhani Xiang, CXMT
 
           
HAR Dielectric Etching: Challenges & Solutions
Jiankun Zhang, NAURA
 
The Art of ICP Etch for 3D Era
Yuping Ren, AMEC







Recent Advances in ICP Etching Systems for Next-Generation Advanced Node Device Fabrication
Zheng Tao, Leuven Instruments

The Uniformity Control for Atomic Layer Deposition Technology
Dongmei Zhai, STIC







AI-Driven Closed-Loop Manufacturing for High-Aspect-Ratio Plasma Etching: From Inverse Recipe Design to Nondestructive Virtual Metrology
Lang Chen, Peking University

Advanced Plasma Diagnostics and Modeling: From Fundamental Plasma Physics to Plasma Etching
XinPei Lu, Huazhong University of Science and Technology







AI and Atomic-Scale Simulation-Driven Optimization for Multi-Material Dry Etching
Zhigang Wang, MRDI

HAR Dielectric Etching: Challenges & Solutions
Ying Guo, Donghua University







Multi-Scale Modeling of Cryogenic Etching: From Plasma Kinetics to Surface Reaction Dynamics
Quanzhi Zhang, Dalian University of Technology










Sean Seutter, Applied Materials  
High-Mobility Indium-Based Oxide Thin Films: Process and Device Technology
Shen Hu, Fudan University
 
           
Development of Low-Temperature Supercritical Fluid Processes for Silicon-Germanium Gate-All-Around Transistors
Dunbao Ruan, Fuzhou University
 
Hf-Vased Ferroelectric Poly-Si Channel FET for NAND Application
Xiaolei Wang, IMECAS
 
           
TBD
Peng Zhao, Peking University

Investigation of Electron Transport in Subthreshold and Transition Regions of Oxide Semiconductor Transistors by Magneto-Transport Measurements
Mengwei Si, Shanghai Jiao Tong University







AI-Enabled Digital Engineering for Process Development and Productivity Enhancement in Semiconductor Manufacturing
Weijun Luo, Lam Research

Latest Progress, Prospects and Challenges on Bulk AlN Crystal Growth by PVT Method
Liang Wu, Ultratrend Technologies Co. Ltd







TBD
Xiaona Zhu, Fudan University

HKMG Key Process in SiGe Channel Device
Xiao Yu, Xian University of Electronic Science and Hangzhou Research InstituteTechnolog







Indium Phosphide Membrane on Silicon (IMOS) Technology and Its Monolithic Integrated Optical Receiver
Jianou Huang, Zhejiang University
 
Virtual Metrology and FDC Early Warning for Semiconductor Smart Manufacturing
Ningmu Zou, Nanjing University
 
           
Applications of Ion Beam Technology in Planarization for Advanced Nodes
Lei Guo, Leuven Instruments

Liming Zhang, ANST (Shenzhen) Co., Ltd.






Yu Huang, HUAWEI
Xiaoqing Wen, Kyushu Institute of Technology






Jiliang Zhang, Nanjing University of Posts and Telecommunications
Patrick Lo, AFM






Jiang Xia, JCET China
Peng Zhao, Peking University






Shen Liu
Wenzhong Bao, Fudan University






AI Drived Advanced IC Equipment and Fab Line Evolution
Chen Wang, Tsinghua University

Deep-Level Defects and Defect-Enabled Property Engineering in Low-Dimensional Semiconductors
Penghong Ci, Institute of Semiconductors, CAS







2D materials devices
Yee Sin Ang, Singapore University of Technology and Design (SUTD)
 
Near Zero-Power MOEMS Sensors Enabled by a Phase Transition
Kaicheng Dong, Tsinghua University
 






Nan Qi, IOSCAS
Ming Hu, BOE






Zhiqiang Xiao, BEMC
Shichang Li, Shengjisheng Semiconductor Technology






Yuyan Wang, Tsinghua University
Peng Wu, Peking University






Zhaoqiang Bai, Beijing Superstring Academy of Memory Technology
Qingyang Du, Zhijiang Lab






Advanced Semiconductor Bonding and Integration: Technologies and Applications
Chao Guo, ISABERS GROUP

Improved Morphology Uniformity of High-Refractive-Index Slanted Gratings via One-Step LEUVEN Instruments RIBS Etching for Mass Production of AR Waveguides
Si Chen, Leuven Instruments







Challenges of Silicon Photonics and Electronic-Photonic Integration Technology
Jin Guo, Chongqing United Microelectronics Center(CUMEC)

Novel Metal and Dielectric Film Deposition Technologies for Advanced 3D Devices
Xun Gu, AMEC







Spin Qubits based on Semiconductor Quantum Dot
Hai-Ou Li, University of Science and Technology of China

Yujie Wang, Institute of Computing Technology, Chinese Academy of Sciences






Yuanqing Cheng, Beihang University
An Zou, Shanghai Jiao Tong University






Zhe Jiang, Southeast University
Shuyao Cheng, Chinese Academy of Sciences






Chen Shen, Peifeng Tunan Semiconductor
Zhenhua Wu, Zhejiang University






Rongmei Chen, Peking University