Symposium VII: Advanced Packaging and Process Integration
Symposium Committee
Symposium VII: Advanced Packaging and Process Integration
As conventional dimensional scaling faces physical limits, advanced packaging and process integration have taken center stage in driving performance enhancement and system diversification. This session addresses the critical convergence of heterogeneous integration, advanced interconnects, and co-optimized process flows for next-generation integrated circuits.
We welcome original contributions on 3D/2.5D integration, chiplet , hybrid bonding, TSVs, co-packaged optics (CPO), fan-out packaging, and SiP solutions. The session also emphasizes process integration challenges involving novel materials, thermal and power integrity, and ESD.
Symposium Committee
|
Prof. Xing Wu Chair |
East China Normal University |
|
Dr. Steve X. Liang Co-Chair |
|
|
Dr. Yifan Guo Co-Chair |
Yibu Semiconductor |
|
Dr. Huili Fu Co-Chair |
HiSilicon |
|
Dr. Mark Huang Member |
Shenzhen University, China |
|
Prof. Mingliang Huang Member |
Dalian University of Technology, China |
|
Prof. Kuan-Neng Chen Member |
National Chiao Tung University |
|
Dr. Shin-Puu Jeng Member |
Director, TSMC |
|
Prof. Wenhui Zhu Member |
Central South University |
|
Mr. John Rowland Member |
Spreadtrum
|
|
Dr. John Yuanlin Xie Member |
Altera Corp., CA, USA |
|
Dr. Roy Yu Member |
IBM, Watson Research Center, USA |
|
Dr. Yishao Lai Member |
ASE, Taiwan, China |
|
Dr. Jing Shi Member |
Oracle, USA |
|
Dr. Young Do Kweon Member |
Samsung, Korea |
|
Dr. Renzhe Zhao Member |
Huawei, China |
|
Dr. Hong SHI Member |
Xilinx |
|
Dr. Tim Bao Member |
Air Products and Chemicals, Inc. |
|
Dr. Tim Chen Member |
Yantai Darbond Technology Co., Ltd. |
|
Dr. Daniel Lu Member |
Henkel |
|
Dr. Wang Su Member |
Sinyang Semiconductor |
|
Prof. Horng-Show (Frank) Koo Member |
University into Taipei University of Marine Technology (TUMT) |
|
|
|
|
Dr. Daquan Yu Member |
Xiamen Sky Semiconductor Co., Ltd. |
|
Dr. Minghai Wang Member |
CTO of Bonotec Electronic Materials |
Symposium VII: Advanced Packaging and Process Integration
As conventional dimensional scaling faces physical limits, advanced packaging and process integration have taken center stage in driving performance enhancement and system diversification. This session addresses the critical convergence of heterogeneous integration, advanced interconnects, and co-optimized process flows for next-generation integrated circuits.
We welcome original contributions on 3D/2.5D integration, chiplet , hybrid bonding, TSVs, co-packaged optics (CPO), fan-out packaging, and SiP solutions. The session also emphasizes process integration challenges involving novel materials, thermal and power integrity, and ESD.