Symposium Chair: Prof. Xinping Qu, Fudan University, China


** to designate keynote talk - 30 min      
* to designate invite talk - 25 min
  to designate regular talk - 15 min

Sunday, March 22, 2026, Kerry Hotel Pudong, Shanghai
Meeting Room: Tower Room 8


Session I: CMP and Advanced Packaging
Session Chair: Xinchun Lu
**13:30-14:00 CMP as an Enabling Technology: Opportunities and Challenges
  Jingoo Park, Hanyang University
**14:00-14:30 CMP in Hybrid Bonding and Advanced Packaging - Challenges and Strategies
  Knut Gottfried, ErzM-Technologies
*14:30-14:55 Emerging CMP Solutions for Advanced Packaging
  Jae-Dong Lee, KC Tech
   

Session II: AI Driven CMP and Cleaning
Session Chair: Yuchun Wang
*14:55-15:20 Machine Learning in Chemical Mechanical Polishing: Marriage of Convenience or True Love Story?
  Jiakai Zhou, Hebei University of Technology
*15:20-15:45 Data Guided Corrosion Control Strategies for Advanced CMP Processes
  Jihoon Seo, Hanyang University
*15:45-16:10 Nanobubbles: a Sustainable Technology in Semiconductor Cleaning
  Lijuan Zhang, Shanghai Advanced Research Institute, Chinese Academy of Sciences
16:10-16:30 Coffee Break
16:30-18:00 Panel Discussion(Meeting Room: Pudong Ballroom 1)
   

Monday, March 23, 2026, Kerry Hotel Pudong, Shanghai
Meeting Room: Tower Room 8


Session III: Si and SiO2 Polishing
Session Chair: Weili Liu
*08:35-09:00 Abrasive Challenges and Transformations in CMP Slurry
  Jiani Chu, Qnity Electronics, Inc.
*09:00-09:25 Understand Prestonian Behavior in CMP
  Shoutian Li, Anji Microelectronics
*09:25-09:50 The Manufacture of Ultra-Clean and Ultra-Flat Silicon Wafers
  Hui Wang, Zhonghuan Advanced Semiconductor Material Co., Ltd
*09:50-10:15 Integrated Strategy for High Efficiency and Low Defect Wafer Planarization Processes
  Lifei Zhang, Tsinghua University
10:15-10:30 Improving Defect Performance in Silicon Buffing Chemical Mechanical Polishing (CMP) through Process integration and Parameters Optimization
  Huaifang Li, Fujian Jinhua Integrated Circuit Co., Ltd
10:30-10:50 Coffee Break
   

Session IV: Metal Polishing
Session Chair: Yonggen He
*10:50-11:15 Atomic-Level Material Removal Mechanism of Copper in Chemical Mechanical Polishing
  Liang Jiang, Southwest Jiaotong University
11:15-11:30 The Effect of Amino Acids Corrosion Inhibitor on Chemical Mechanical Polishing of Molybdenum
  Qiancheng Sun, Fudan University
11:30-11:45 The Effect of Phosphate-Functionalized Anionic Surfactants on the CMP Performance of Ruthenium-Based Copper Interconnect Films
  Shaobo Song, Hebei University of Technology
11:45-12:00 Effects of Oxidants and Complexing Agents on Enhancing the Removal Rate of Ti Barrier Layers during Chemical Mechanical Polishing Process
  Qinhua Miao, China University of Mining & Technology-Beijing
12:00-13:30 Lunch Break
   

Session V: Dielectrics CMP
Session Chair: Shoutian Li
*13:30-13:55 Development of a Chemical-Mechanical Action-based Predictive Framework for CMP MRR and Micro-topography
  Ping Zhou, Dalian University of Technology
*13:55-14:20 Regulation Strategies of Novel Mesoporous Ceria Abrasives for Advanced CMP
  Wei Yuan, Fudan University
14:20-14:35 Investigation of Inhibitor Effects in STI CMP Slurries Based on Mesoporous Ceria
  Linyi Shen, Fudan University
   

Session VI: CMP of Compound Semiconductor
Session Chair: Baoguo Zhang
*14:35-15:00 Structural Conversion of Silicon Carbide Abiding Increase of Entropy and Its Polishing Mechanism
  Tao Sun, Shanghai Institute of Technology
*15:00-15:25 Ultra-flat Surface and Gradient Etching for Advanced Application Using Ion Beam Trimming
  Zichao Li, Jiangsu Leuven Instruments Co. Ltd
15:25-15:40 A Novel ICP-Assisted CMP Hybrid Approach for Ultra-Smooth 4H-SiC
  Bingyi Shen, Shanghai Jiao Tong University
15:40-15:55 Effect of Surfactants on the Properties of C-, R-, and M-Plane Sapphire
  Mengqi Wang, Hebei University of Technology
15:55-16:10 Effect of Complexing Agents on CMP Properties of C-, A-, and M- Plane Sapphire
  Qing Ma, Hebei University of Technology
   
16:10-18:00 Coffee Break
16:00-18:00 Poster Session: Monday, March 23 (3F, Kerry Hotel Pudong, Shanghai)
 5-1 Shaped Abrasives for Advanced CMP Technology
  Zuozuo Wu, Zhejiang University
 5-9 Study on the CMP Rate Selectivity of and Cobalt Films in Cobalt Interconnects
  Zhuoya Xing, Hebei University of Technology
 5-13 Study on the Process of 3D Structure Semiconductor Multilayer Thin Film W CMP
  Jian Li, Beijing Superstring Academy of Memory Technology
 5-14 The Influence of Glycine on The Removal Rate Selectivity of Titanium Nitride-Based Cobalt Interconnects
  Yuanshen Cheng, Hebei Geo University
 5-16 Influence of Process Parameters on Material Removal in Chemical Mechanical Polishing: A Stress Distribution Modeling for Optimizing Polishing Uniformity
  Yuanzhen Huang, Zhejiang University
 5-17 Kinematic Analysis of Wafer-Pad Relative Motions for Chemical Mechanical Polishing
  Shukan Jian, Zhejiang University
 5-20 The Study of STI CMP with Ceria-Based Slurry to Resolve Worse Particle Performance
  Kewen Wang, Applied Materials China
 5-23 Advanced Rinse Strategies for Defect Control in Metal CMP
  Weiguo Wang, Applied Materials China
 5-24 Optimizing Pad Groove Pattern for Better NU in Cu CMP
  Yixuan Liu, Applied Materials China
 5-25 HPPC Close Loop Control for Cu CMP Process Stability and Productivity Improvement
  Na Xiao, Applied Materials China
 5-26 BSLR Inline Discolor Defect Improvement with iAPC Application
  Mengyao Liu, Applied Materials China
 5-27 BSI Bonding Loop Edge Issue Improvement by CMP
  Yan Gao, Applied Materials China
 5-28 Cu CMP Barrier Platen Oxide-Cu Selectivity Analysis and Tuning
  Youlai Xiang, Applied Materials China
 5-31 Advanced CMP Slurry for Cu-Cu Hybrid Bonding in Advanced Packaging of Semiconductor
  Dennis Kim, Qnity Electronics
 5-36 Process Characteristics and Impact of STI-CMP Post-Rinse Steps
  Yu Yao, Semiconductor Technology Innovation Center (Beijing) Corporation, Beijing, China
 5-37 Impact of Wafer Transfer for CuO Residues During Cu CMP
  Yu Yao, Semiconductor Technology Innovation Center (Beijing) Corporation, Beijing, China
 5-41 Fluorine Doping for Enhanced CMP Performance: Boosting Ce3?/Oxygen Vacancies in One-step Synthesized Ceria Abrasives
  Wei Yuan, Fudan Univerisity
 5-42 Preparation and Performance Optimization of Boron-doped Ultrasmall Cerium Oxide Abrasives for Higy-Efficiency CMP
  Wei Yuan, Fudan Univerisity
 5-46 Ultra-High Purity Non-Spherical Silica Sol for Silicon Polishing in Integrated Circuits
  Zuozuo Wu, Zhejiang University