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Prof. Tibor Grasser is an IEEE Fellow and head of the Institute for Microelectronics at TU Wien. He has edited various books, e.g. on the bias temperature instability, hot carrier degradation, and low-frequency noise (all with Springer), is a distinguished lecturer of the IEEE EDS, has been involved in outstanding conferences such as IEDM (General Chair 2021), IRPS, SISPAD (General Chair 2007), ESSDERC (TPC Co- Chair 2015), and IIRW (General Chair 2014), is a recipient of the Best and Outstanding Paper Awards at IRPS (2008, 2010, 2012, 2014, and 2023), IPFA (2013 and 2014), ESREF (2008) and the IEEE EDS Paul Rappaport Award (2011). He served as an Associate Editor for IEEE T-ED and Microelectronics Reliability (Elsevier).
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