Dr. Francis JEN
KLA Tencor, China

Francis Jen received his Ph.D. degree in Chemistry from the University of Southern California in Los Angeles, California in 2000, and his BS degree in Physics from the National Tsing Hua University, Hsinchu, Taiwan in 1991. He has joined KLA-Tencor in U.S. headquarter in 2000 as senior Applications engineer and later as senior Applications manager for Darkfield wafer inspection technology, and senior product marketing manager in Brightfield wafer inspection technology. Currently he serves as the technical director for KLA-Tencor China since 2007.