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Ph.D. in Materials Science and Engineering from the National University of Singapore. Co-authored 2 books, with over 100 publications and more than 10 patents. Dr. Liu has over 20 years of experience in materials characterization and failure analysis, specializing in the application and development of transmission electron microscopy (TEM), focused ion beam (FIB), and associated spectroscopy techniques in the field of semiconductor device failure analysis.
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