Dr. Xiaoqing WEN

Kyushu Institute of Technology, Japan

Xiaoqing WEN received the B.E. degree from Tsinghua University, China, in 1986, the M.E. degree from Hiroshima University, Japan, in 1990, and the Ph.D. degree from Osaka University, Japan, in 1993. He was an Assistant Professor with Akita University, Japan, from1993 to 1997, and a Visiting Researcher with the University of Wisconsin–Madison, USA, from Oct. 1995 to Mar. 1996. He joined SynTest Technologies Inc., USA, in 1998, and served as its Vice President and Chief Technology Officer until 2003. He joined Kyushu Institute of Technology, Japan, in 2003, where he is currently a Full Professor. He is a Co-Founder and Co-Chair of Technical Activity Committee on Power-Aware Testing under Test Technology Technical Council (TTTC) of IEEE Computer Society. He is serving as Associate Editors for IEEE Transactions on Very Large Scale Integration Systems (TVLSI) and Journal of Electronic Testing: Theory and Applications (JETTA). He co-authored and co-edited the latest VLSI text textbook in 2006 and the first comprehensive book on power-aware VLSI testing in 2009. His research interests include design, test, and diagnosis of VLSI circuits. He has published more than 300 papers and holds 43 U.S. patents & 14 Japan patents. He received the 2008 Society Best Paper Award from the Information Systems Society (ISS) of Institute of Electronics, Information and Communication Engineers (IEICE). He is a Fellow of IEEE. (https://www.vlab.cse.kyutech.ac.jp/~wen/index.htm)