Symposium Chair: Prof. Qianqian Huang, Peking University, China


** to designate keynote talk - 30 min      
* to designate invite talk - 25 min
  to designate regular talk - 15 min

Sunday, March 22, 2026, Kerry Hotel Pudong, Shanghai
Meeting Room: Pudong Ballroom 6


Session I: Advances in CMOS Technologies
Session Chair: TBD
*13:30-13:55 Backside Power Delivery: an Industry Perspective
  Han Li, Southest University
*13:55-14:20 Design Strategies for High-Density CFET-Based SRAM
  Vita Pi-Ho Hu, Taiwan University
14:20-14:35 Investigation of Channel Stress in Monolithic CFET with Different SiGe Sacrificial Layers for A7 Technology Node
  Lei Cao, Institute of Microelectronics of the Chinese Academy of Sciences
14:35-14:50 Increasing NSFET Design Flexibility with SheetOpt™
  Dmitry Yakimets, Huawei Technologies R&D Belgium
14:50-15:05 A High Selective Contacts Scheme for 3D Sequencial CFETs Via One-step Etching and Low-K Etch Stop Layer
  Zhongshan Xie, Institute of Microelectronics of Chinese Academy of Science
15:05-15:15 Break Time
   

Session II: CMOS Reliability
Session Chair: TBD
*15:15-15:40 Predicting Long Term Random Telegraph Noise: Challenge and Potential Solutions
  Jianfu Zhang, Southest University
*15:40-16:05 Three-Dimensional Thermal Measurements of 3D Integrated Circuits
  Zhe Cheng, Peking University
16:05-16:20 Effect of Deuterium Thermal Treatment on Low Frequency Noise and Hot Carrier Injection Characteristics of Devices
  Gang WANG, Hangzhou GHS Semiconductor Corporation
16:20-16:30 Coffee Break
16:30-18:00 Panel Discussion(Meeting Room: Pudong Ballroom 1)
   

Monday, March 23, 2026, Kerry Hotel Pudong, Shanghai
Meeting Room: Pudong Ballroom 6


Session III: Memory and Computing I
Session Chair: TBD
*08:45-09:10 Self-Powered Memristor for Biomimetic Sensory Computing
  Suting Han, Hong Kong PolyU
*09:10-09:35 Synaptic and Neural Behaviours in A Standard Silicon Transistor
  Mario Lanza, National University of Singapore
09:35-09:50 Two-Dimensional Hexagonal Boron Nitride Based Memristors for Spiking Neural Network
  Yuzhe Lin, Zhejiang University
09:50-10:05 High-Performance CMOS-Compatible Self-Rectifying Memristor Array Based on a-InGaZnO Films
  Haoze Yu, Zhejiang University
10:05-10:20 Transfer-Electrode Enabled Uniform and Reliable Switching in AlOx Volatile Memristors
  Yichun Gong, Zhejiang University
10:20-10:35 Coffee Break
   

Session IV: Memory and Computing II
Session Chair: TBD
*10:35-11:00 In-Memory Computing for Large Language Model
  Shaodi Wang, Witmem
*11:00-11:25 Spintronics for Unconventional Computing
  Qiming Shao, The Hong Kong University of Science and Technology
11:25-11:40 A Novel Hybrid TFET-CMOS CIM Accelerator Targeting Event-driven Intelligent Wake-up Chips for AIoT Applications
  Rong Zhao, Anhui University
12:00-13:00 Women in Electron Device/Young Professionals Panel Session (with Lunch Box and Lucky Draw)
13:00-13:30 Break Time
   

Session V: Advances in Ferroelectric Memories
Session Chair: TBD
*13:30-13:55 Chance and Challenges of FeRAM for Storage Class Memory
  Huihui Li, Changxin Memory Technologies
*13:55-14:20 From Material Design to Device Optimization: Enabling Robust HZO Embedded FeRAM Reliability
  Yiming Sun, Huawei Technologies Co., Ltd.
*14:20-14:45 Overcoming Depolarization Effects: Novel Strategies for Robust Ferroelectricity in Nanoscale HfO₂ and ZrO₂
  Ruyue Cao, University of Cambridge
*14:45-15:10 HfO₂ based FeFET for High Reliability Memory and Compute-in-Memory Applications
  Kechao Tang, Peking University
15:10-15:25 Enhancing Cryogenic Ferroelectric Performance of HZO Capacitors via ZrO₂ Interlayer Engineering
  Jiayan Zhu, Peking University
15:25-15:40 A Novel Anti-Ferroelectric FET-based Schmitt Trigger with Low Operating Voltage and High Hardware-Efficiency
  Bingrui Song, Peking University
15:40-18:00 Coffee Break
16:00-18:00 Poster Session



Tuesday, March 24, 2026, Kerry Hotel Pudong, Shanghai
Meeting Room: Function Room 2


Session VI: Advances in Emerging Channel Meterial Devices
Session Chair: TBD
*08:45-09:10 High Performance Transistor and Memory Based on 2D Materials
  Jiangbin Wu, Institute of Semiconductors, CAS
*09:10-09:35 Subnanosecond 2D Flash Memory
  Chunsen Liu, Fudan University
*09:35-10:00 MOS Interfaces of Emerging Channel Materials (e.g., Ge, 2D Materials)
  Mengnan Ke, Yokohama National University
10:00-10:15 Hybrid 2t0c Cell with Oxide-Semiconductor/Silicon Transistors for Capacitor-Free DRAM
  Lin Bao, State Key Laboratory of Information Photonics and Optical Communications, Beijing University of Posts and Telecommunications
10:15-10:30 Effects of HfAlOx Composition and Annealing Schemes on the Electrical Performance of IGZO TFTs
  Hongrui Liu, Zhejiang University
10:30-10:45 Break Time
   

Session VII: Advances in Process, Power Devices and Photoconductor Devices
Session Chair: TBD
10:45-11:00 Low-K Replacement Process for AC Performance Improvement on 28NM High-K Metal Gate Platform
  Zhijian Huang, Shanghai Huali Integrated Circuit Manufacturing Co., LTD
11:00-11:15 Design and Development of GaN-based Complementary Logic Integrated Circuits
  Xuanming Zhang, Xi'an Jiaotong-Liverpool University
11:15-11:30 Normally-Off P-GAN Gate HEMTS Enabled By Oxygen Plasma Treatment with Al₂O₃ Oxygen-Rich Capping Layer
  Jiachen Duan, Xi'an jiaotong-Liverpool University
11:30-11:45 Characterization of Cr-compensated GaAs Detector for X-ray Detection Applications
  Zeyu Sun, Shanghai Jiaotong University
   
16:00-18:00 Poster Session: Monday, March 23 (3F, Kerry Hotel Pudong, Shanghai)
  PS-Level Testing Solution for TDC Measure in T2000 ISS
  Bin Gong, Advantest
  Mass Production Scheme of CIS Test for 2-Channel Event Sensor on T2000 ISS
  Bin Gong, Advantest
  A Process induced Program Disturb Issue and Solution for ESF3 Memory
  Yaoyi Zhou, SMIC Beijing
  A N-Buffer Implantation Method for Safe Operation Area Improvement in Contact-Field-Plate LDMOS Device
  Yiting Ye, Zhejiang University
  Complementary FET with Top Truncated CombFET for Enhanced Routing Efficiency at Advanced Technology Nodes
  Xin Wang, Institute of Microelectronics, Chinese Academy of Sciences
  Improvement Of A Polycrystalline Silicon Doped DTI Structure
  Shangze Wu, HuaHong Grace Semiconductor Manufacturing Corporation
  Design of a Rechargeable High-Voltage Resistant Resistor
  Shangze Wu, HuaHong Grace Semiconductor Manufacturing Corporation
  Design of a High Voltage LDMOS
  Shangze Wu, HuaHong Grace Semiconductor Manufacturing Corporation
  Design of a High Voltage Charging Diode
  Shangze Wu, HuaHong Grace Semiconductor Manufacturing Corporation
  Electronic Properties of Silicon with Intrinsic Stacking Fault
  Wenwen Fei, GHS Semiconductor Co. Ltd.
  Improving Switching and Static Characteristics of 60 V LDMOS: A Study on The Influence of Field Plate, Gate, and Drift Region Design
  Boying Meng, Zhejiang University
  A Novel Doping Structure for a Low Dark Count Rate and High Photon Detection Efficiency SPAD
  Juntao Zhang, Nanjing University
  Impact of the First Spacer Anneal on Device Performance Enhancement in CMOS Technology
  Zi Qiu, Shanghai University
  Research on the Performance Improvement of 22nm NMOSFETS by High-Pressure Hydrogen Annealing
  Huasong Liu, Shanghai University
  Improvement on Gate Disturb for SONOS Memory via Tuning Nitrogen-Oxygen Ratio of ONO Dielectric Layer
  Jingsong Peng, Shanghai Huahong Grace Semiconductor Manufacturing Corporation
  A Mirror-Gate SONOS Memory with Program Operation by Hot Carrier Injection
  Jingsong Peng, Shanghai Huahong Grace Semiconductor Manufacturing Corporation
  Design Technology Co-Optimization of a Hybrid Dual-κ Spacer Strategy for Sub-3-nm Nanosheet GAAFETs and Circuits Performance Enhancement
  Meihe Zhang, Institute of Microelectronics of the Chinese Academy of Sciences
  The Improvement of Local CDU in Small OX via Etch
  Brian Zhang, Advanced Micro-Fabrication Equipment Inc
  A Novel Deep Trench Isolation Structure for Enhanced Breakdown and Holding Voltage Performance
  Jian Ma, HuaHong Grace Semiconductor Manufacturing Corporation
  High-Performance LDMOS With A Novel Stepped-Field Plate Optimized by Simulation
  Yiyang Yao, Zhejiang University
  High Resistance Induced SRAM Reverse Vmin Ratio
  Yue Yang, GHS Semiconductor
  Band Gap Engineering for Enhanced Performance in Novel SONOS Flash Memory
  Zikuan Yang, Zhejiang University
  A Novel HVIC Structure with Enhanced Punch-Through Voltage by Innovative HVRING Design
  Jian Ma, HuaHong Grace Semiconductor Manufacturing Corporation
  Heated Ion Implantation Technology for FinFET Source Drain Extension Formation
  Ruijun Cui, Shanghai Kingstone Semiconductor Joint Stock Co., Ltd.
  A Structurally Optimized Sion Passivation for High-Voltage MIM Capacitors
  Wenbin Huang, Zhejiang University
  A TCAD and Experimental Study of Metal Ring for High-Voltage Capacitive Isolators
  Huaxu Zhao, Zhejiang University
  A Trapezoid Fin/Nanowire Hybrid LDMOS for SoC Integration in GAA Technology
  Chih-Sheng Keng, Zhejiang University
  A Verification of Hot-Hole Injection During Drain Disturb in NOR Flash
  WanBo Geng, Hangzhou GHS Semiconductor Corporation
  A Novel Split-Gate MOSFET Design with Central Floating Field Plate for Enhanced Reliability in Silicon-Based Power Devices
  Yiming Zhang, Zhejiang University
  Impact of Memory-Gate Length on Trap Rebalancing and Reliability in 3T2b SONOS Flash
  Zhexuan LI, Zhejiang University
  Design and Optimization of 60V LDMOS in 0.18μm BCD Platform with Enhanced Performance via Asymmetric STI Engineering
  Huan Zhong, Zhejiang University
  A Novel Silicon Fin-TFET Technology Based on Foundry Platform
  Yifan Ma, Peking University
  Source Lifetime Improvement on HCS by Dedicated Carbon with Dilution Gas
  Xiangdong Liu, Applied Materials China
  Surface Charging Control Engineering Enable Better Uniformity for Implant Performance
  Li Cheng, Applied Materials China
  Application of Ni-Based Ohmic Contacts to 150mm n-Type 4H-SiC in XE+
  Yitong Guo, Applied Materials China
  Enhanced Gate Resistance (Rg) uniformity in IGBT Devices Using Superscan on VIIstaTM Trident XP2
  Helin Wang, Applied Materials China
  Successful Implementation of Dose Rate Matching of Fluorine Implantation
  Yiqun Jiang, Applied Materials China
  A GNN-Based Surrogate Device Simulation Model for MOSFETs
  Jiayi Xia, Zhejiang University