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Chinese
2020年6月27-29日
上海新国际博览中心

IC Reliability Tests for 5G Applications

Date: Monday, March 16, 2020
Venue: Shanghai International Convention Center
Room: 5H
   
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Xu Feng
Deputy General Manager & Technology Director
JCET quality test center


许峰,江苏长电科技股份有限公司品质试验中心副总,技术负责人,可靠性试验及失效分析专家。曾参与江苏省半导体协会QFP产品标准的制订,半导体集成电路外型尺寸国家标准的起草。

Xu Feng is a deputy general manager & technology director of JCET quality test center. He is an expert in semiconductor reliability test and FA. He has participated in the formulation of the QFP product standard of the jiangsu semiconductor association and the drafting of the national standard for the external dimensions of semiconductor integrated circuits.