Fisher Zhang 张震宇
GM, Complex SOC BU, Asia, Teradyne
泰瑞达Complex SOC 事业部亚太区总经理

讲师简介 / Speaker Bio

Fisher Zhang is General Manager of Complex SOC Business Unit in Asia, Semiconductor Test Division at Teradyne. His focus includes leading edge solutions in computing, automotive, wireless as well as innovation and excellence in emerging market.
Fisher has been in Semiconductor Automated Testing (ATE) industry for more than 17 years. He joined Teradyne in 2017 and prior to that, he held different roles as expert / manager in application engineering, sales and marketing at Advantest and Cohu.
Fisher received B.S. and M.S. in Circuits and System and Information Engineering from Southeast University in 2003 and 2006 respectively.

摘要 / Abstract

Chiplet and Heterogeneous Integration become more popular in recent years. There are multiple challenges from design, manufacturing, assembly, as well as testing. The strategy of optimizing the overall cost of quality remains crucial, while we are dealing with much more complicated test flows such as Known Good Die (KGD) test, final test, and system level test (SLT). These strategies include characterizing and debugging failures early in the design process, before new product introduction or high volume ramp, by enabling designers and test engineers to collaborate utilizing a common set of tools; shifting certain testing earlier in the manufacturing flow to reduce defect escapes and enable “Known Good” die/sub-assemblies; delaying some testing to later in the manufacturing process to reduce test costs and expand the ability to both technically and economically detect defects; and as manufacturing processes mature and stabilize, analyzing these processes and ultimately moving tests around in the manufacturing flow to optimize the overall cost of quality. Collaborations from EDA company, DFT, operations, foundry, OSATs, ATE-SLT vendors would be crucial to success.