Date: 15:30-17:00, Monday, March 15, 2021
Venue: Shanghai International Convention Center
Room: 5H
   

Title：Reliability Test of Automotive IC

Xu Feng
Deputy General Manager & Technology Director
JCET Quality Test Center

Biography

许峰，江苏长电科技股份有限公司品质试验中心副总，技术负责人，可靠性试验及失效分析专家。曾参与江苏省半导体协会QFP产品标准的制订，半导体集成电路外型尺寸国家标准的起草。

Xu Feng is a deputy general manager & technology director of JCET quality test center. He is an expert in semiconductor reliability test and FA. He has participated in the formulation of the QFP product standard of the jiangsu semiconductor association and the drafting of the national standard for the external dimensions of semiconductor integrated circuits.

   
  Introduction
科学技术的发展，使得汽车越来越自动化、智能化、电动化，电子产品在汽车零部件中的比例不断提高。汽车电子的可靠性越来越多的影响到了汽车的安全性、舒适性。汽车电子的可靠性检测大多按照AEC的相关标准执行，但标准中的检测项目很多，需要选择合适的检测项目，既可以节省时间和成本，又可以得到更准确的结果。

With the development of science and technology, cars are becoming more and more automated, intelligent and electric, and the proportion of electronic products in auto parts is increasing. The reliability of automotive has more and more affected the safety and comfort . The reliability test of automotive is mostly follow AEC standards, but there are many items in the standards, so it is necessary to select effective test, which can not only save time and cost, but also get more accurate results.