Date: 15:30-17:00, Monday, March 15, 2021
Venue: Shanghai International Convention Center
Room: 5H

Title:Reliability Test of Automotive IC

Xu Feng
Deputy General Manager & Technology Director
JCET Quality Test Center



Xu Feng is a deputy general manager & technology director of JCET quality test center. He is an expert in semiconductor reliability test and FA. He has participated in the formulation of the QFP product standard of the jiangsu semiconductor association and the drafting of the national standard for the external dimensions of semiconductor integrated circuits.


With the development of science and technology, cars are becoming more and more automated, intelligent and electric, and the proportion of electronic products in auto parts is increasing. The reliability of automotive has more and more affected the safety and comfort . The reliability test of automotive is mostly follow AEC standards, but there are many items in the standards, so it is necessary to select effective test, which can not only save time and cost, but also get more accurate results.