March 20-22, 2019
Shanghai New International Expo Centre

Keynote & Invited Speakers

Keynote & Invited Speakers(2019)

The Floating-Gate Memory—From Concept to Flash Memory to Digital Age
Dr. Simon M. Sze, Honorary Chair Professor, NCTU
Dr. Yaoguo (Gary) Ding, Vice President, Intel    
Semiconductor Innovation and Scaling: A Foundry Perspective
Dr. Min Cao, Vice of President, Path-finding, TSMC
"In-memory Computing": Accelerating AI Applications
Dr. Evangelos Eleftheriou, Fellow, Neuromorphic Computing, IBM
Sponsored by:
Partial List of Other Confirmed Distinguished CSTIC 2019 Invited Speakers
Accelerating Deep Neural Networks with Analog Memory Devices
Dr. Geoff Burr, IBM
Non-volatile Memory for Neuromorphic Computing
Prof. Sangbum Kim, Seoul Natioanl University
Towards Efficient AI On-a-chip: A Joint Hardware-algorithm Approach
Prof. Yu Cao, Arizona State University
        Van der Waals Pt/WSe2 Contact for Steep Slope Negative Capacitance and Strong Unipolar p-type Field Effect Transistors
Prof. Yang Chai, Hong Kong Polytechnic University
Scaling and Printing Electronics Using Nanomaterials
Prof. Aaron D. Franklin, Duke University
AC NEGF simulation: Efficient implementation and application to nanosheet MOSFETs
Prof. Sung-Min Hong, Gwangju Institute of Science and Technology
STT-MRAM Materials and Devices
Dr. Guohan Hu, IBM Watson Research Center
ReRam for alternative computing architectures
Prof. Khaled N. Salama, UCSD
Super steep switching CMOS device technology
Prof. Changhwan Shin, Sungkyunkwan University
Steep-Slope Hysteresis-Free Negative-Capacitance 2D Transistors
Prof. Peide Ye, Purdue University
Design & Technology Co-optimization for High Performance Mobile SoC Productization
Dr. Jun Yuan, Qualcomm
New Understanding of Negative Capacitance Devices for Low-Power Logic Applications
Prof. Qianqian Huang, Peking University
  Understanding the negative capacitance in nanoscale by two-dimensional phase field simulations
Cheol Seong Hwang, Seoul National University
Novel gap filling BARC with high chemical resistance
Mr. Yuto Hashimoto, Nissan Chemical Corporation
High Power LPP-EUV Source with Long Collector Mirror Lifetime for Semiconductor High Volume Manufacturing
Dr. Hakaru Mizoguchi, Gigaphoton Inc.
  Advances in IC Mask Synthesis and Tape Out Operations in the era of Machine Learning
Dr. Steffen Schulze, Mentor Graphics
Reduction and control of edge placement error at the 5nm node through a holistic approach
Dr. Robert Socha, ASML
Advanced Lithography Material Status toward 5nm Node and beyond
Dr. Koichi FUJIWARA, JSR Shanghai Co., Ltd.
Pattern fidelity control on EUV via hole towards 5-nm node
Hidetami Yaegashi, Tokyo Electron Limited
Multi-beam mask writer MBM-1000
Dr. Hiroshi Matsumoto, NuFlare Technology
EUV Lithography optics - current status and outlook
Dr. Dirk Juergens, Carl Zeiss SMT GmbH
        Evolution of Lithographic Materials Enabling the Semiconductor Industry
Dr. Cheng-Bai Xu, DowDuPont
Tailoring Material and Process Variables to Control Planarization Properties at ≤ 7-nm nodes
Daniel M. Sullivan, Brewer Science
Study of CD-SEM based and other reference metrologies for line width roughness (LWR) control on EUV photoresist and less than 20nm width materials
Dr. Takeshi Kato, Hitachi High Technologies
Boosting computational lithography performance with high speed metrology and machine learning technology
Dr. Gary Zhang, ASML-Brion
Will Conley, ASML-Cymer
Ryan Pearman, D2S
Multi-Beam Mask Writer for Advanced Patterning
Naoya Hayashi, Dai Nippon Printing Co., Ltd.(DNP)
Kazuyo Morita, Oji Holdings
Takahashi, Canon
Defectivity Reduction in EUV Lithography Materials using Advanced Filtration Technologies
Rao Varanasi, Pall Corporation
Thin Film Characterization for advanced patterning
Dr. Zhimin Zhu, Brewer Science
  Modeling and simulation approaches to atomistic control in etch and deposition processes: the role of surface modification and the catalytic nature of hydrogen
Dr. P. L. G. Ventzek, TEL
Towards the New Understanding of VHF Plasma Uniformity: Measurements of RF Magnetic Fields and Plasma Conduction Current in VHF Plasma Sources
Dr. Jianping Zhao, TEL
  Atomic level surface treatment by down-stream plasma generated radicals
Dr. Xinliang Lu, Mattson Technology
        Single Wafer Clean Challenges and Status
David Wang, ACM
Kaidong Xu, Leuevn Instrument
David Huang, Pall
Ying Huang, AMAT
        Advanced Si Etch System for 14nm and beyond
Tomoki Suemasa, Beijing NAURA Microelectronics Equipment Co. Ltd.
Cobalt Electrofill for Future Generations of Contacts and Interconnects
Tighe Spurlin, Lam Research
Direct Copper Damascene Fill on Cobalt Liner Structures
Lee Brogan, Lam Research
Developments of Cu Barrier/liner Materials for 10nm CMOS Technology Node & Beyond
Dr. Xiaoping Shi, Naura
        Low K challenge for 7 and 5nm technology nodes
Dr. Kang Sub Yim, AMAT
Advanced Nanoscale Magnetic Tunnel Junctions for Low Power Computing
Prof. Weisheng Zhao, Beihang University
        Advanced Ti-based silicides Ohmic contacts in sub-16/14 nm nodes
Dr. Jun Luo, IMECAS
  Alternative metallization for advanced interconnects
Dr. Christoph Adelmann, IMEC
Integration Options for Enabling Fully Self Aligned Via
Gayle Murdoch, IMEC
Dr. Ji Chul Yang, SK Hynix
The Characteristics of PVA Brushes in Post CMP Cleaning
Prof. Jin-Goo Park, Hanyang University
  CMP mechanism of GISI multilevel interconnect
Prof. Yuling Liu, Hebei University of Technology
        Advances in CMP Formulations Technology
Dr. Hongjun Zhou, Versum materials
High rate ceria slurry and pad combo solution for bulk oxide CMP
Dr. Jinfeng Wang, Cabot Microelectronics
High Dilution Ceria Slurry and Auto Stop Ceria Slurry for Bulk Oxide CMP
Dr. Xiansheng Yin, Anji Microelectronics Technology (Shanghai) Co. Ltd.
A Study on the Mechanical Role of Pad Asperities in Chemical-Mechanical Polishing
Prof. Sanha Kim, Korea Advanced Institute of Science and Technology
Beyond Planarization, into the Realm of Multifunctional Polishing
Dr. Hong Jin Kim, Globalfoundries
Study and Improvement on Tungsten Recess in CMP Process
Dr. Lei Zhang, Shanghai Huali Microelectronics Corporation
Opportunities and Challenges of CMP technology for advanced memory manufacturing
Dr. Yukiteru Matsui, Toshiba Memory Corp.
Reliability challenges for advanced interconnect systems
Dr. Kristof Croes, IMEC
The Hype, Myths, and Realities of Testing 2.5D/3D Integrated Circuits
Prof. Krishnendu Chakrabarty, Duke University
  Reliability Verification: Why it is complex, important and beneficial?
Sridhar Srinivasan, Mentor Graphics
Gary Ditmer, Lam Research
Jason Shields, Lam Research
Dr. Evgeni Gousev, Qualcomm
Dr. Victor Zhirnov, SRC
How to Successfully Overcome Inflection Points by using the Technology Roadmap methodology
Dr. Paolo A. Gargini, International Roadmap for Devices and Systems (IRDS)
Meng-Fan (Marvin) Chang, National Tsing Hua University
  Process Overview of Area-Selective Deposition; Surface-Determined Patterning Technology toward Advanced Nanofabrication
Prof. WooHee Kim, Jeonbuk National University
Hybrid Solid State Chemoresistive and Fluctuation-Enhanced Gas Sensors: Exhaled Breath and Indoor Air Analysis
Prof. Lars Österlund, Uppsala University
A novel gate junction design for low noise Si Nanowire ISFET Sensors
Prof. Zhen Zhang, Uppsala University
Chemical and Biological Sensing with Hybrid Plasmonic-Photonic Crystal Nanomaterials
Prof. Alan Xiaolong Wang, Oregon State University
Analog Resistive Switching Memory for Neural-Network Processing Unit
Prof. Bin Gao, Hsinghua University
Manufacturing Technology of Phase Change Memory (PcRAM) for AI/IoT and Smart Society
Dr. KouKou Suu, ULVAC
AI: From Deep Learning to In-Memory Computing
Hsiang-Lan Lung, Macronix
The implementation of semiconductor based biosensors into Point of Need systems for the automatized analysis of complex samples
Andreas Morschhauser, Fraunhofer ENAS
The Life of SPICE as A Transient Circuit Simulator
Prof. Chung-Kuan Cheng, UC San Diego
Edge Computing
for Intelligent Healthcare
Prof. X. Sharon Hu, University of Notre Dame
Prof. Xin Li, Duke University
DTCO is the New Moore’s Law for Advanced Logic and Memory
Dr. Victor Moroz, Synopsys Inc.

Prof. Lei He, UC Los Angeles
Not your father’s timing anymore - novel approaches to timing of digital circuits
Prof. Ulf Schlicthmann, Technical University of Munich
Computing-in-Memory for Binary Neural Networks
Prof. Shimeng Yu, Georgia Institute of Technology
Prof. Xuan Zeng, Fudan University
Dadu - Processor Design for Robot
Prof. Yinhe Han, Institute of Computing Technology, Chinese Academy of Science
Design Automation of Digital Microfluidic Biochips
Prof. Krishnendu Chakrabarty, Duke University
Accelerate Analog Circuit Simulation
Senhua Dong, Huada Emprean Inc.
A 1μw-to-100μw Output Range Boost DC-DC with Pseudo Open Loop Structure and Power Efficient Ring Oscillator for Wireless Energy Harvesting
Prof. Le Ye, Peking University
Dr. Davids Wu, Horizon Shanghai IC Design Center